A technique for evaluating the application of the pin-level stuck-at fault model to VLSI circuits
Daniel L Palumbo
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“A technique for evaluating the application of the pin-level stuck-at fault model to VLSI circuits” by Daniel L Palumbo: a public-domain book in “Engineering…
Catalogue details
- Author
- Daniel L Palumbo
- Category
- Engineering & Technology
- Language
- English
- Source
- HathiTrust